The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2023
Filed:
Mar. 15, 2021
Micro Focus Llc, Santa Clara, CA (US);
Peng-Ji Yin, Shanghai, CN;
Xiao-Fei Yu, Shanghai, CN;
Shuhui Fu, Shanghai, CN;
Yi-Bin Guo, Shanghai, CN;
Micro Focus LLC, Santa Clara, CA (US);
Abstract
Applications under test (AUT) may be tested by automated testing systems utilizing machine vision to recognize visual elements presented by the AUT and apply inputs to graphical elements, just as a human would. By utilizing the smallest image patch available, processing demands of the testing system are minimized. However, the image patch used to identify a portion of an AUT must be identifiable to the automated system. By selecting image patches that comprise the smallest size, but can be identified in an AUT by an automated system using machine vision, even as the AUT display is resized, reproportioned, noisy, or otherwise altered from the testing platform that was utilized for training.