The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2023

Filed:

Nov. 20, 2020
Applicant:

CM HK Limited, Fortress Hill, HK;

Inventors:

Shun-Nan Liou, Taipei, TW;

Zhou Ye, Taipei, TW;

Chin-Lung Li, Taipei, TW;

Assignee:

CM HK LIMITED, Fortress Hill, HK;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/0346 (2013.01); G06F 3/038 (2013.01); G01C 21/16 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0346 (2013.01); G01C 21/1654 (2020.08); G06F 3/0383 (2013.01);
Abstract

A representative method involves: generating measured angular velocities and measured axial accelerations; calculating a resulting deviation associated with movements and rotations in a spatial reference frame by: providing a previous quaternion corresponding to time T−1 based on the measured axial accelerations corresponding to time T−1 and the measured angular velocities corresponding to time T−1; converting the measured angular velocities corresponding to time T based on the previous quaternion into a current quaternion and predicted axial accelerations; comparing the predicted axial accelerations with the measured axial accelerations corresponding to time T to obtain a first comparison result; obtaining an updated quaternion associated with time T based on the current quaternion and the first comparison result, and using the updated quaternion as a next occurrence of the previous quaternion; and providing the resulting deviation based on the updated quaternion; and, providing content based on the resulting deviation in the spatial reference frame.


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