The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2023
Filed:
Feb. 06, 2020
Fanuc Corporation, Yamanashi, JP;
Wei Luo, Yamanashi, JP;
Tsutomu Nakamura, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A frequency characteristic measurement device that measures the frequency characteristic of a measurement target includes: a multi-sine signal generation unit that generates a multi-sine signal; a sweep sinusoidal wave generation unit that generates a plurality of sweep sinusoidal waves; an input signal switching unit that selects any one of the multi-sine signal and the sweep sinusoidal waves so as to input the selected one to the measurement target; a data acquisition unit that acquires, at a predetermined sampling frequency, sampling data of an input signal which is input to the measurement target and sampling data of an output signal which is output from the measurement target; and a characteristic calculation unit that calculates a frequency characteristic including the gain and the phase of the input and output signals in the measurement target from the sampling data of the input and output acquired.