The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2023

Filed:

Feb. 04, 2022
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Benoit Derat, Munich, DE;

Mert Celik, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/32 (2006.01); G01R 29/08 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0892 (2013.01); G01R 29/105 (2013.01);
Abstract

A method of simulating an effect of interactions between a device under test and a scattering object by of a hybrid over-the-air (OTA) test system is described. The method includes the steps of determining at least one radiation parameter of the device under test, wherein the at least one radiation parameter is associated with electromagnetic waves emitted by the device under test; determining an equivalent source on a Huygens surface based on the at least one determined radiation parameter, wherein the equivalent source is associated with the device under test; assigning material properties to a Huygens box confined by the Huygens surface, wherein the material properties are associated with at least one of reflection of electromagnetic waves and absorption of electromagnetic waves; and simulating an electromagnetic interaction between the device under test and the scattering object based on the determined equivalent source and based on the assigned material properties.


Find Patent Forward Citations

Loading…