The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2023

Filed:

Jul. 16, 2018
Applicants:

Wisconsin Alumni Research Foundation, Madison, WI (US);

Universitat Hamburg, Hamburg, DE;

Inventors:

Robert Blick, Hamburg, DE;

Paul Gwozdz, Hamburg, DE;

Abhishek Bhat, Madison, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/487 (2006.01); C12Q 1/6869 (2018.01); G01N 33/58 (2006.01); G01N 27/447 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/48721 (2013.01); C12Q 1/6869 (2013.01); G01N 33/588 (2013.01); G01N 27/44791 (2013.01); G01N 2015/0065 (2013.01);
Abstract

A method to determine the throughput speed v of a pore, comprising the steps of feeding, by means of a driving force F, a filiform calibration element through the pore, the calibration element having a plurality of markers spaced apart by known distances and configured to produce an interaction event that transmits a signal away from the pore upon interaction with the pore, detecting a plurality of interaction events, and determining a time interval Δt between successive interaction events, and/or a frequency ω of interaction events.


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