The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2023

Filed:

Dec. 21, 2018
Applicant:

Dow Technology Investments Llc, Midland, MI (US);

Inventors:

Ademola Idowu, Lake Jackson, TX (US);

Louise A. Mahoney, Freeport, TX (US);

Robert M. Callender, Lake Jackson, TX (US);

Clair J. Emery, Hahnville, LA (US);

Assignee:

Dow Technology Investments LLC, Midland, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 30/06 (2006.01); G01N 30/12 (2006.01); G01N 30/30 (2006.01); G01N 30/78 (2006.01);
U.S. Cl.
CPC ...
G01N 30/12 (2013.01); G01N 30/30 (2013.01); G01N 30/78 (2013.01);
Abstract

Automated systems and methods for obtaining of the concentration of impurities in a liquid ethylene oxide product stream are shown and described. The systems and methods employ remote injection and flash vaporization of small volumes of liquid ethylene oxide into a carrier gas to minimize polymerization of the ethylene oxide and accumulation of polymerized ethylene oxide. Ethylene oxide peaks are diverted from the gas chromatograph effluent detector to stabilize baseline signal errors and avoid errors in the calculation of an impurity with an adjacent retention time peak. The systems and methods may be used for feedback, feedforward, dynamic matrix, and/or model-based predictive control of ethylene oxide purity. The systems and methods reduce lag times and errors associated with relying on laboratory analyses to make process adjustments.


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