The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2023

Filed:

Oct. 01, 2021
Applicant:

Baker Hughes Oilfield Operations Llc, Houston, TX (US);

Inventor:

Nils Rothe, Hürth, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2018.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G06T 5/50 (2013.01); G01N 2223/316 (2013.01); G01N 2223/401 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30168 (2013.01);
Abstract

Systems and methods for scatter correction of x-ray images are provided. A scatter image of an object can be corrected using partial-scatter free images acquired using an aperture plate. The plate is positioned between an object and a radiation detector and includes apertures in a grid. The original x-rays pass through the apertures and scattered x-rays can be blocked by the aperture plate. The aperture plate can be moved to different positions, allowing partial scatter-free images to be acquired at each position of the aperture plate. A full scatter-free image can be generated by combining partial scatter-free images. The scatter and scatter-free images can be further used to train scatter correction models.


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