The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2023
Filed:
Oct. 05, 2020
Raytheon Technologies Corporation, Farmington, CT (US);
Jonathan Gilson, West Hartford, CT (US);
Joseph V. Mantese, Ellington, CT (US);
Gurkan Gok, Milford, CT (US);
Goran Djuknic, New York, NY (US);
Coy Bruce Wood, Ellington, CT (US);
RAYTHEON TECHNOLOGIES CORPORATION, Farmington, CT (US);
Abstract
A system of a machine includes a waveguide system and a radio frequency transceiver/detector coupled to the waveguide system and configured to emit a calibration signal in the waveguide system to establish a reference baseline between the radio frequency transceiver/detector and a calibration plane associated with an aperture of the waveguide system, emit a measurement signal in the waveguide system to transmit a radio frequency signal from the radio frequency transceiver/detector out of the aperture of the waveguide system, and detect a reflection of the measurement signal at the radio frequency transceiver/detector based on an interaction between the measurement signal and a component of the machine. A measurement result of the reflection of the measurement signal can be adjusted with respect to a reflection of the calibration signal.