The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2023

Filed:

Dec. 08, 2015
Applicant:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Inventors:

Kurt Klonig, Mannheim, DE;

Marc Moldt, Mannheim, DE;

Christine Nortmeyer, Mannheim, DE;

Assignee:

ROCHE DIAGNOSTICS OPERATIONS, INC., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 37/12 (2006.01); G01N 27/327 (2006.01); B32B 38/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
B32B 37/12 (2013.01); B32B 38/0008 (2013.01); G01N 21/6428 (2013.01); G01N 27/3272 (2013.01);
Abstract

A method and a production device for producing a test element are disclosed. The method comprises providing in a transport step a continuous substrate tape, wherein the tape is transported in a transport direction parallel to a direction of extension of the continuous substrate tape; applying in an adhesive application step at least one continuous adhesive strip, wherein the strip is applied to the continuous substrate tape with a liquid adhesive and a slot coating process, and wherein the continuous adhesive strip is oriented parallel to the transport direction; applying in a cover element application step at least one cover element, wherein the at least one cover element is applied to the continuous adhesive strip, thereby securing the cover element to the continuous substrate tape; and individualizing in an individualization step the continuous substrate tape, wherein the tape is individualized into single test elements.


Find Patent Forward Citations

Loading…