The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2023
Filed:
May. 03, 2022
Qcify Inc., San Mateo, CA (US);
Raf Peeters, San Mateo, CA (US);
Pieter Boogaerts, Sint-Katelijne-Waver, BE;
Joachim Van der Perre, Houthalen, BE;
Bert Switten, Sacramento, CA (US);
Qcify Inc., San Mateo, CA (US);
Abstract
A method for generating a quality inspection data block for a distributed ledger includes: determining an identification code associated with a sample to be inspected, inspecting the sample and thereby generating quality inspection data associated with the sample, and after completion of the inspecting of the sample combining the identification code and the quality inspection data into the quality inspection data block. The method also includes adding the quality inspection data block to the distributed ledger. An inspector including a sensor that senses a characteristic of a sample, a memory that stores sensor output data, and a processor configured to: determine an identification code associated with a sample to be inspected, generate quality inspection data based on the sensor output data, and combine the identification code and the quality inspection data into a quality inspection data block. In one example, the inspector is an in-flight 3D inspector.