The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Jul. 12, 2022
Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventors:

Guo-Yau Lin, Fairport, NY (US);

Eliud Robles Flores, Webster, NY (US);

David R Stookey, Walworth, NY (US);

Varun Sambhy, Pittsford, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/60 (2006.01);
U.S. Cl.
CPC ...
H04N 1/6033 (2013.01); H04N 1/6008 (2013.01);
Abstract

A system and method provide for automated evaluation of reference point pairs. For each of a set of reference point pairs in an input color space, a straight line connecting the reference points is sampled to generate a set of sampled points. Each of the set of sampled points in the input color space is converted to a sampled point in an output color space. For each of a set of color separations in the output color space, discontinuities are identified, based on the set of sampled points in the output color space. Candidate reference point pairs are identified in the set of reference point pairs for which at least one discontinuity is identified. The candidate reference point pairs can be validated by printing test sweeps, which are each derived from a respective set of sampled points in the output color space, and identifying contour artifacts in the printed test sweeps.


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