The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Mar. 04, 2020
Applicant:

Omron Corporation, Kyoto, JP;

Inventor:

Hisanori Igarashi, Muko, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 43/045 (2022.01); H04L 43/08 (2022.01);
U.S. Cl.
CPC ...
H04L 43/045 (2013.01); H04L 43/08 (2013.01);
Abstract

This monitoring system, which monitors communication related to an FA network, comprises: data collection units () that collect data indicating a communication status on the FA network; a data analysis unit () that analyzes the collected data according to pre-registered information related to settings for communication on the FA network, and generates monitoring setting information for monitoring the communication; and monitoring units () that monitor, according to the monitoring setting information, a communication to be monitored.


Find Patent Forward Citations

Igarashi, Hisanori. (2023). Monitoring system, setting device, and monitoring method (U.S. Patent No. 11695660). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11695660

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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