The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Jul. 30, 2019
Applicant:

Beijing Naura Microelectronics Equipment Co., Ltd., Beijing, CN;

Inventor:

Xingfei Mao, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01L 21/683 (2006.01); H01L 21/687 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32715 (2013.01); H01J 37/32642 (2013.01); H01L 21/6833 (2013.01); H01L 21/68721 (2013.01); H01L 21/68742 (2013.01); H01J 2237/20235 (2013.01); H01J 2237/334 (2013.01);
Abstract

The present disclosure discloses a lift thimble system, a reaction chamber, and semiconductor processing equipment, including a wafer thimble device configured to lift a wafer from a base by rising or drop the wafer onto the base by descending, and a focus ring thimble device configured to lift a focus ring from an initial position of the focus ring by rising to cause an inner ring area of an upper surface of the focus ring to lift an edge area of the wafer, or cause the focus ring to return to the initial position by descending. The technical solutions of the system, the reaction chamber, and the equipment of the present disclosure improve maintenance efficiency of an abnormal situation, and double the service lifetime of the focus ring. Moreover, the technical solutions may further realize replacement of the focus ring without damaging reaction chamber vacuum to improve efficiency.


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