The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2023
Filed:
Oct. 05, 2018
Flatiron Health, Inc., New York, NY (US);
Benjamin Edward Birnbaum, New York, NY (US);
Joshua Daniel Haimson, Brooklyn, NY (US);
Lucy Dao-Ke He, New York, NY (US);
Melissa Hedberg, New York, NY (US);
Nathan Coleman Nussbaum, South Orange, NJ (US);
Paul Stephen Richardson, Brooklyn, NY (US);
Katharina Nicola Seidl-Rathkopf, Brooklyn, NY (US);
Evan Eino Estola, Brooklyn, NY (US);
Peter Daniel Larson, Brooklyn, NY (US);
Flatiron Health, Inc., New York, NY (US);
Abstract
Systems and methods are disclosed for monitoring models for bias. In one implementation, a system for automatically assessing a deployed model for selection of a cohort may include a processing device programmed to: apply the deployed model to data representing a first plurality of individuals, the data including at least one characteristic of the first plurality of individuals; based on the application, select a subset of the first plurality of individuals as a cohort; receive data representing a second plurality of individuals labeled as within the cohort, the data including the at least one characteristic of the second plurality of individuals; compare the selected subset and the second plurality of individuals along the at least one characteristic; and determine whether the comparison results in a difference between the selected subset and the second plurality of individuals greater than a threshold.