The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2023
Filed:
Jan. 24, 2018
Applicant:
Sequenom, Inc., San Diego, CA (US);
Inventors:
John A. Tynan, San Diego, CA (US);
Amin Mazloom, Del Mar, CA (US);
Yijin Wu, San Diego, CA (US);
Mark Whidden, La Jolla, CA (US);
Mathias Ehrich, San Diego, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16B 20/10 (2019.01);
U.S. Cl.
CPC ...
G16B 20/10 (2019.02);
Abstract
Technology provided herein relates in part to non-invasive classification of one or more genetic copy number variations (CNVs) for a test sample. Technology provided herein is useful for classifying a genetic CNV for a sample as part of non-invasive pre-natal (NIPT) testing and oncology testing, for example.
Tynan, John. (2023). Methods and processes for assessment of genetic variations (U.S. Patent No. 11694768). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11694768
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile