The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Sep. 27, 2014
Applicant:

University of Washington, Seattle, WA (US);

Inventors:

Jay Shendure, Seattle, WA (US);

Andrew Adey, Seattle, WA (US);

Joshua Burton, Seattle, WA (US);

Jacob Kitzman, Seattle, WA (US);

Maitreya J. Dunham, Seattle, WA (US);

Ivan Liachko, Seattle, WA (US);

Assignee:

UNIVERSITY OF WASHINGTON, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16B 5/00 (2019.01); G16B 30/00 (2019.01); G16B 20/00 (2019.01); G16B 20/20 (2019.01); G16B 30/20 (2019.01); G16B 30/10 (2019.01); G16B 40/00 (2019.01);
U.S. Cl.
CPC ...
G16B 5/00 (2019.02); G16B 20/00 (2019.02); G16B 20/20 (2019.02); G16B 30/00 (2019.02); G16B 30/10 (2019.02); G16B 30/20 (2019.02); G16B 40/00 (2019.02);
Abstract

Computational methods used for large scale scaffolding of a genome assembly are provided. Such methods may include a step of applying a location clustering model to a test set of contigs to form two or more location cluster groups, each location cluster group comprising one or more location-clustered contigs; a step of applying an ordering model to each of the two or more location cluster groups to form an ordered set of one or more location-clustered contigs within each cluster group; and a step of applying an orienting model to each ordered set of one or more location-clustered contigs to assign a relative orientation to each of the location-clustered contigs within each location cluster group. In some aspects, the test set of contigs are generated from aligning a set of reads generated by a chromosome conformation analysis technique (e.g., Hi-C) with a draft assembly, a reference assembly, or both.


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