The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2023
Filed:
Apr. 29, 2021
Kyocera Document Solutions Inc., Osaka, JP;
Kilho Shin, Los Angeles, CA (US);
Kendrick Esperanza Wong, Torrance, CA (US);
KYOCERA Document Solutions Inc., Osaka, JP;
Abstract
A system employs a trained model to detect artifact(s) associated with artifact type(s) appearing in a reproduction of a source image (a test image). The system determines differences between the test image and the source image and outputs probabilities that the artifact(s) in the test image are associated with each of the artifact type(s). A dataset for training the model includes: (i) a reference category including reference image(s) without any artifacts; and (ii) artifact categories, each corresponding to a respective one of the artifact types and including noised images associated with the respective artifact type. Each noised image includes one of the reference images and an artifact associated with the respective artifact type. The model is trained to detect the artifact type(s) by providing the model with the dataset and causing the model to process differences between each noised image and the reference image in the noised image.