The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Dec. 28, 2020
Applicant:

Wistron Neweb Corporation, Hsinchu, TW;

Inventors:

An-Ting Hsiao, Hsinchu, TW;

Shun-Chung Kuo, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); H02J 50/00 (2016.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); H02J 50/00 (2016.02);
Abstract

A method for analyzing electromagnetic characteristic includes steps as follows. An electromagnetic evaluation model establishing step is performed, which includes establishing an object unit, a power transmitting unit, and a simulating unit. The object unit is an arbitrary geometry shape. The power transmitting unit has an electromagnetic signal. The simulating unit is defined as at least one base point emitting a plurality of beams to form a plurality of projection points. An electromagnetic reference model is provided, wherein the object unit and the power transmitting unit are combined to form the electromagnetic reference model. A comparing step is performed, wherein a radiation pattern data of the electromagnetic reference model and a radiation pattern data of the electromagnetic evaluation model are obtained by the electromagnetic signal, respectively, and the two radiation pattern data are compared to obtain an electromagnetic gain difference value.


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