The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Aug. 25, 2022
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventor:

Dharmalingam Madheswaran, Fremont, CA (US);

Assignee:

Splunk Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/24 (2019.01); G06F 16/248 (2019.01); H04L 41/22 (2022.01); G06F 16/245 (2019.01); G06F 16/28 (2019.01); G06F 16/25 (2019.01); G06F 9/451 (2018.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/248 (2019.01); G06F 9/451 (2018.02); G06F 16/22 (2019.01); G06F 16/245 (2019.01); G06F 16/252 (2019.01); G06F 16/285 (2019.01); H04L 41/22 (2013.01);
Abstract

An example method comprises: causing display of a user interface comprising a plurality of dynamic elements, the user interface to facilitate configuring a search frequency for metrics associated with the plurality of dynamic elements, wherein each metric represents a respective point in time or a period of time and is derived from a metric-time search of machine data associated with a respective asset node; and for each dynamic element of the plurality of dynamic elements: receiving, via the user interface, a search frequency for a metric associated with the dynamic element; and determining a value of the metric by executing, according to the search frequency for the metric, a search query associated with the dynamic element.


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