The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2023
Filed:
Dec. 27, 2019
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Xin Wu, Shanghai, CN;
Jignesh Bhadaliya, Irvine, CA (US);
Min Gong, Shanghai, CN;
Meng Wang, Shanghai, CN;
Minglong Sun, Shanghai, CN;
EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);
Abstract
Facilitating outlier object detection in tiered storage systems is provided herein. A system can comprise a processor and a memory that stores executable instructions that, when executed by the processor, facilitate performance of operations. The operations can comprise determining respective parameters associated with objects of a group of objects of a tiered storage system. The respective parameters can comprise at least one of a size, an access percentage, or a cost. The operations also can comprise using the respective parameters associated with the objects of the group of objects as inputs and performing data clustering on the group of objects, resulting in at least one data cluster. Further, the operations can comprise selecting at least one object from the group of objects as at least one outlier object within the tiered storage system based on the at least one data cluster.