The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2023
Filed:
Oct. 15, 2019
Applicant:
Nvidia Corporation, San Jose, CA (US);
Inventors:
Gunaseelan Ponnuvel, San Jose, CA (US);
Ashish Karandikar, Cupertino, CA (US);
Assignee:
NVIDIA Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/27 (2006.01); G06F 11/07 (2006.01); G06F 1/3296 (2019.01); G05D 1/00 (2006.01); G06F 11/22 (2006.01); G06F 1/3225 (2019.01); G11C 29/50 (2006.01); G01R 31/30 (2006.01); G06F 11/263 (2006.01); G01R 31/52 (2020.01); G06F 11/30 (2006.01); G06F 11/10 (2006.01); G01R 31/3187 (2006.01); G06F 11/24 (2006.01);
U.S. Cl.
CPC ...
G06F 11/27 (2013.01); G05D 1/0055 (2013.01); G05D 1/0088 (2013.01); G06F 1/3296 (2013.01); G06F 11/076 (2013.01); G06F 11/0793 (2013.01); G01R 31/3004 (2013.01); G01R 31/3187 (2013.01); G01R 31/52 (2020.01); G06F 1/3225 (2013.01); G06F 11/1048 (2013.01); G06F 11/22 (2013.01); G06F 11/2236 (2013.01); G06F 11/24 (2013.01); G06F 11/263 (2013.01); G06F 11/3024 (2013.01); G06F 11/3062 (2013.01); G11C 29/50 (2013.01);
Abstract
In various examples, permanent faults in hardware component(s) and/or connections to the hardware component(s) of a computing platform may be predicted before they occur using in-system testing. As a result of this prediction, one or more remedial actions may be determined to enhance the safety of the computing platform (e.g., an autonomous vehicle). A degradation rate of a performance characteristic associated with the hardware component may be determined, detected, and/or computed by monitoring values of performance characteristics over time using fault testing.