The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Jul. 15, 2022
Applicant:

Openlight Photonics, Inc., Goleta, CA (US);

Inventors:

Steven William Keck, Mountain View, CA (US);

Roberto Marcoccia, San Jose, CA (US);

Steve McGowan, San Jose, CA (US);

Assignee:

OpenLight Photonics, Inc., Goleta, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2013.01); G02B 6/42 (2006.01); G02B 27/62 (2006.01);
U.S. Cl.
CPC ...
G02B 6/4227 (2013.01); G02B 6/4225 (2013.01); G02B 6/4239 (2013.01); G02B 27/62 (2013.01);
Abstract

An optical pick and place machine that includes a self-calibrating optical controller for error feedback based optical placement of optical components using active alignment is described. The optical controller can include a loopback mode to generate a baseline value of light generated by a light source and measured by a photodetector within the optical controller. The optical controller can further include an active alignment mode in which the light is coupled from the pick and place machine to the optical device on which the component is placed. The optical coupling of the placed component can be evaluated against the baseline value to ensure that the optical coupling is within specification (e.g., within a prespecified range).


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