The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2023
Filed:
Aug. 30, 2019
Applicant:
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Inventors:
Assignee:
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/20 (2006.01); H04N 5/911 (2006.01); G01N 21/45 (2006.01);
U.S. Cl.
CPC ...
G02B 5/20 (2013.01); H04N 5/911 (2013.01); G01N 21/455 (2013.01);
Abstract
An optical test apparatus includes a light convergence element, an optical filter, and an image sensor. The light convergence element converges light from a subject. The optical filter is arranged on an optical axis of the light convergence element. The image sensor is arranged in an effective region not crossing the optical axis of the light convergence element, and receives light passing through the light convergence element and the optical filter.
Kano, Hiroya. (2023). Optical test apparatus and optical test method (U.S. Patent No. 11693162). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11693162
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