The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Aug. 30, 2018
Applicant:

The Trustees of Princeton University, Princeton, NJ (US);

Inventors:

Etienne Bachmann, Trenton, NJ (US);

Jeroen Tromp, Princeton, NJ (US);

Gregory L. Davies, New York, NY (US);

Daniel Steingart, Princeton, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G01N 29/06 (2006.01); G01N 29/26 (2006.01); G01N 29/34 (2006.01); G01N 29/44 (2006.01); G01S 15/89 (2006.01); G01S 7/52 (2006.01);
U.S. Cl.
CPC ...
G01S 15/8993 (2013.01); A61B 5/00 (2013.01); G01N 29/0654 (2013.01); G01N 29/348 (2013.01); G01S 7/52003 (2013.01); G06T 2200/08 (2013.01);
Abstract

This disclosure provides a system and method for producing ultrasound images based on Full Waveform Inversion (FWI). The system captures acoustic/(an)elastic waves transmitted through and reflected and/or diffracted from a medium. The system performs an FWI process in a time domain in conjunction with an accurate wave propagation solver. The system produces 3D maps of physical parameters that control wave propagation, such as shear and compressional wavespeeds, mass density, attenuation, Poisson's ratio, bulk and shear moduli, impedance, and even the fourth-order elastic tensor containing up to 21 independent parameters, which are of significant diagnostic value, e.g., for medical imaging and non-destructive testing.


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