The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Oct. 05, 2021
Applicants:

Board of Trustees of Michigan State University, East Lansing, MI (US);

Wisconsin Alumni Research Foundation, Madison, WI (US);

Inventors:

Stuart Holden Tessmer, Okemos, MI (US);

Eric William Goodwin, Dewitt, MI (US);

Oleksandr Levchenko, Middleton, WI (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/12 (2010.01); G01Q 60/22 (2010.01); G01N 33/58 (2006.01); G01Q 60/16 (2010.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01Q 60/22 (2013.01); G01N 33/588 (2013.01); G01Q 60/16 (2013.01); G01N 21/6458 (2013.01);
Abstract

A quantum dot microscope apparatus is provided. A further aspect employs a tilted or tapered end or tip on a microscopic probe. Another aspect of the present apparatus employs a probe including a quantum dot with only one tunneling lead connected to a power source. A manufacturing aspect includes creating a tapered or asymmetrically shaped specimen-facing end of a probe where a quantum dot is located on the end. A further manufacturing aspect includes using focused ion-beam milling to create a tip or end of a quantum dot microscope probe.


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