The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Jun. 18, 2020
Applicant:

Arkray, Inc., Kyoto, JP;

Inventor:

Naotsugu Onuma, Kyoto, JP;

Assignee:

ARKRAY, INC., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01); G01N 33/49 (2006.01); G01N 27/416 (2006.01);
U.S. Cl.
CPC ...
G01N 27/44721 (2013.01); G01N 27/4163 (2013.01); G01N 27/44747 (2013.01); G01N 33/491 (2013.01);
Abstract

There is provided a separation analysis method for analyzing a sample component s included in a sample liquid by introducing the sample liquid into a separation flow path filled with a flow path liquid, the method comprising: obtaining a correction factor representing a proportion of a time period from the first point in time when the sample liquid is introduced into the separation flow path, to the second point in time when an interface between the flow path liquid and the sample liquid reaches a predetermined position at the separation flow path, with respect to a time period from the first point in time to the third point in time when an optical characteristic value of the sample component is measured at the predetermined position, and correcting the measured optical characteristic value with the correction factor.


Find Patent Forward Citations

Onuma, Naotsugu. (2023). Sample component separation analysis method (U.S. Patent No. 11692966). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11692966

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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