The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2023
Filed:
Nov. 28, 2016
Applicant:
Hitachi High-technologies Corporation, Tokyo, JP;
Inventors:
Assignee:
Hitachi High-Tech Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01N 33/543 (2006.01); G01N 21/27 (2006.01); G01N 21/25 (2006.01); G01N 15/10 (2006.01); B01L 3/00 (2006.01); G01N 21/03 (2006.01); G01N 21/49 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/0332 (2013.01); B01L 3/50 (2013.01); G01N 15/1012 (2013.01); G01N 21/03 (2013.01); G01N 21/27 (2013.01); G01N 21/274 (2013.01); G01N 21/49 (2013.01); G01N 35/00 (2013.01); G01N 35/00584 (2013.01);
Abstract
As a standard solution for evaluating a scattered light measuring optical system mounted on an automated analyzer, a standard solution containing an insoluble carrier at a concentration, at which transmittance is in a range of 10% to 50%, is used, and a light quantity of a light source is adjusted such that a scattered light detector outputs a predetermined value.
Quick Actions:
Adachi, Sakuichiro. (2023). Automatic analyzer and standard solution for evaluating scattered light measurement optical system thereof (U.S. Patent No. 11692929). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11692929
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile