The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2023
Filed:
Oct. 29, 2019
Applicant:
Japan Aerospace Exploration Agency, Tokyo, JP;
Inventors:
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G01M 99/00 (2013.01); G05B 23/0243 (2013.01);
Abstract
An abnormality diagnostic device includes a diagnoser configured to diagnose a type of abnormality that occurs in an abnormality diagnostic target on the basis of differences between abnormality simulation results for each type of abnormalities obtained by simulating a plurality of types of abnormalities in the abnormality diagnostic target and a plurality of time-series observation results obtained by observing the abnormality diagnostic target in time series using a plurality of detectors.
Kawatsu, Kaname. (2023). Abnormality diagnostic device, abnormality diagnostic method, and program (U.S. Patent No. 11692910). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11692910
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