The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2023
Filed:
Sep. 11, 2020
Topcon Corporation, Tokyo, JP;
Tadayuki Ito, Tokyo, JP;
Kenichiro Yoshino, Tokyo, JP;
Yoshihiro Nishi, Tokyo, JP;
Motohiro Miyajima, Tokyo, JP;
Topcon Corporation, Tokyo, JP;
Abstract
To provide a three-dimensional survey apparatus, a three-dimensional survey method, and a three-dimensional survey program which are capable of suppressing an occurrence of a data-deficient part. A three-dimensional survey apparatus includes a collimating ranging unit, a scanner unit, and a control calculation portion. If there is a data-deficient part where three-dimensional data is not acquired among a measurement object when the scanner unit acquires point cloud data, the control calculation portion executes control to replenish the three-dimensional data related to the data-deficient part having been acquired by the collimating ranging unit to the point cloud data having been acquired by the scanner unit.