The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2023
Filed:
Feb. 27, 2020
Faro Technologies, Inc., Lake Mary, FL (US);
Oliver Zweigle, Stuttgart, DE;
João Santos, Kornwestheim, DE;
Aleksej Frank, Stuttgart, DE;
Ahmad Ramadneh, Kornwestheim, DE;
Muhammad Umair Tahir, Stuttgart, DE;
Tobias Boehret, Aidlingen, DE;
FARO Technologies, Inc., Lake Mary, FL (US);
Abstract
A system and method for measuring three-dimensional (3D) coordinate values of an environment is provided. The method including moving a 2D scanner through the environment. A 2D map of the environment is generated using the 2D scanner. A path is defined through the environment using the 2D scanner. 3D scan locations along the path are defined using the 2D scanner. The 2D scanner is operably coupled to a mobile base unit. The mobile base unit is moved along the path based at least in part on the 2D map and the defined path. 3D coordinate values are measured at the 3D scan locations with a 3D scanner, the 3D scanner being coupled to the mobile base unit.