The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2023
Filed:
Aug. 06, 2018
Elbit Systems Land and C4i Ltd., Netanya, IL;
Ilya Leizerson, Netanya, IL;
Barak Alfassi, Netanya, IL;
Alon Heimer, Netanya, IL;
Sharone Aloni, Netanya, IL;
Adam Wolff, Netanya, IL;
Elbit Systems Land and C4I Ltd., Netanya, IL;
Abstract
A method and a system for photoacoustic inspection of a part are provided herein. The method may include the following steps: photo-acoustically exciting a predetermined position in a predetermined region on a part by pulsed laser illumination, to yield ultrasonic excitation of the part; coherently illuminating a predetermined location in the predetermined region on the part; detecting an illumination scattered from the predetermined location; determining, based on the scattered illumination, a plurality of sequence of two or more temporally-sequential de-focused speckle pattern images, wherein each of the sequences corresponds to one of the predetermined illuminated locations; and determining a set of translations, each determined based on the sequences, wherein each translation in the set is determined based on two temporally-sequential speckle patterns images in the respective sequence.