The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Sep. 28, 2018
Applicant:

Viavi Solutions Inc., San Jose, CA (US);

Inventors:

Zhao Yuan, Jiangsu, CN;

Markus K. Tilsch, Santa Rosa, CA (US);

Georg J. Ockenfuss, Santa Rosa, CA (US);

Marius Grigonis, Santa Rosa, CA (US);

Andrew Clark, Santa Rosa, CA (US);

Donggong Peng, Jiangsu, CN;

Yinxiang Xia, Jiangsu, CN;

Eric Nybank, Aptos, CA (US);

Neil Pinkerton, Santa Rosa, CA (US);

Assignee:

VIAVI Solutions Inc., Chandler, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/34 (2006.01); C23C 14/54 (2006.01); C23C 14/35 (2006.01); C23C 14/00 (2006.01); C23C 14/52 (2006.01);
U.S. Cl.
CPC ...
C23C 14/547 (2013.01); C23C 14/0042 (2013.01); C23C 14/35 (2013.01); C23C 14/52 (2013.01); C23C 14/54 (2013.01); H01J 37/3464 (2013.01); H01J 37/3476 (2013.01);
Abstract

A device may include one or more memories and one or more processors, communicatively coupled to the one or more memories, to receive design information, wherein the design information identifies desired values for a set of layers of an optical element to be generated during one or more runs; receive or obtain historic information identifying a relationship between a parameter for the one or more runs and an observed value relating to the one or more runs or the optical element; determine layer information for the one or more runs based on the historic information, wherein the layer information identifies run parameters, for the set of layers, to achieve the desired values; and cause the one or more runs to be performed based on the layer information.


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