The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2023
Filed:
Feb. 03, 2021
Applicant:
Rogers Corporation, Chandler, AZ (US);
Inventors:
Assignee:
ROGERS CORPORATION, Chandler, AZ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01F 1/34 (2006.01); H01F 1/11 (2006.01); C01G 51/00 (2006.01); C04B 35/26 (2006.01); C08K 3/22 (2006.01);
U.S. Cl.
CPC ...
C01G 51/66 (2013.01); C08K 3/22 (2013.01); H01F 1/348 (2013.01); C01P 2004/04 (2013.01); C01P 2004/64 (2013.01); C08K 2003/2265 (2013.01); C08K 2201/001 (2013.01); C08K 2201/005 (2013.01); C08K 2201/01 (2013.01); C08K 2201/011 (2013.01);
Abstract
In an aspect, a CoZ ferrite has the formula: (BaSr)CoMFeO. M is at least one of Mo, Ir, or Ru. The variable x can be 0 to 0.8, or 0.1 to 0.8. The variable y can be 0 to 0.8, or 0.01 to 0.8. The variable z can be −2 to 2. The CoZ ferrite can have an average grain size of 5 to 100 nanometers, or 30 to 80, or 10 to 40 nanometers as measured using at least one of transmission electron microscopy, field emission scanning electron microscopy, or x-ray diffraction.