The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Jun. 18, 2019
Applicant:

Avava, Inc., Waltham, MA (US);

Inventors:

Joseph Ting, Acton, MA (US);

Charles Holland Dresser, Wayland, MA (US);

Jayant Bhawalkar, Auburndale, MA (US);

Assignee:

Avava, Inc., Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/064 (2014.01); B23K 26/03 (2006.01); B23K 26/062 (2014.01); B23K 103/00 (2006.01);
U.S. Cl.
CPC ...
B23K 26/064 (2015.10); B23K 26/032 (2013.01); B23K 26/062 (2015.10); B23K 2103/50 (2018.08);
Abstract

A method includes depositing a plurality of dopant particles within a predetermined region of a transparent material. The method also includes focusing a laser beam along an optical axis to a focal region that overlaps with at least a portion of the predetermined region. The focal region can irradiate at least a first dopant particle of the plurality of dopant particles. The method further includes adjusting a parameter of the laser beam to generate a plasma configured to form an inclusion within the transparent material. The method additionally includes scanning the focal region along a path within the transparent material to elongate the inclusion generally along the path.


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