The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2023

Filed:

Sep. 03, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Muhammad Nazmul Islam, Littleton, MA (US);

Juergen Cezanne, Ocean Township, NJ (US);

Arash Mirbagheri, San Diego, CA (US);

Awlok Singh Josan, San Francisco, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/0417 (2017.01); H04B 7/0404 (2017.01); H04B 7/06 (2006.01); H04W 36/30 (2009.01); H04L 5/00 (2006.01); H04W 36/06 (2009.01);
U.S. Cl.
CPC ...
H04B 7/0417 (2013.01); H04B 7/0404 (2013.01); H04B 7/0628 (2013.01); H04L 5/0007 (2013.01); H04L 5/0048 (2013.01); H04L 5/0057 (2013.01); H04W 36/06 (2013.01); H04W 36/305 (2018.08);
Abstract

In an aspect, the present disclosure includes a method, apparatus, and computer readable medium for wireless communications for establishing, by a user equipment (UE), a first time period to evaluate one or more quality parameters of one or more reference signals, wherein the first time period is based on at least one of a number of panels of the UE or a number of beams that the UE monitors simultaneously; determining, by the UE, a quality parameter of a beam or a cell based on the one or more quality parameters of the one or more reference signals; and determining, by the UE, whether the one or more quality parameters of the one or more reference signals exceeds a quality threshold.


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