The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2023
Filed:
Sep. 15, 2021
Oracle International Corporation, Redwood Shores, CA (US);
David Granholm, Bloomington, MN (US);
Rajesh Balu, Bangalore, IN;
Ananth Venkata, San Ramon, CA (US);
John Fuller, Chicago, IL (US);
ORACLE INTERNATIONAL CORPORATION, Redwood Shores, CA (US);
Abstract
In accordance with an embodiment, described herein is a system and method for providing key performance indicator (KPI) customization in an analytic applications environment, which enables data analytics within the context of an organization's enterprise software application or data environment, or a software-as-a-service or other type of cloud or computing environment. The system supports customization derived from multiple layers which, in aggregate, can yield a customized performance metric or KPI object. In accordance with an embodiment, the system enables creation of a customized KPI, by layering variations of the KPI information on an original (e.g., out-of-the-box or factory) KPI object which are merged at runtime to create the final customized KPI. Each delta-KPI can itself also support multiple, e.g., site/user levels/layers. The approach can be used to provide extensibility for user interface decks/dashboards on which KPI visualization objects, such as decks, cards, dashboards, or other types of visualizations, appear.