The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2023

Filed:

Jul. 11, 2019
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Shuchu Han, Princeton Junction, NJ (US);

LuAn Tang, Pennington, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06N 3/04 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/04 (2013.01);
Abstract

Methods and systems for optimizing performance of a cyber-physical system include training a machine learning model, according to sensor data from the cyber-physical system, to generate one or more parameters for controllable sensors in the cyber-physical system that optimize a performance indicator. New sensor data is collected from the cyber-physical system. One or more parameters for the controllable sensors are generated using the trained machine learning module and the new sensor data. The one or more parameters are applied to the controllable sensors to optimize the performance of the cyber-physical system.


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