The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2023
Filed:
Jan. 29, 2021
Splunk Inc., San Francisco, CA (US);
Ian Edward Torbett, Dublin, CA (US);
Lila Fridley, San Francisco, CA (US);
Tristan Antonio Fletcher, Pleasant Hill, CA (US);
Ayyappa Muthusami, Fremont, CA (US);
Tanner Gilligan, San Bruno, CA (US);
Splunk Inc., San Francisco, CA (US);
Abstract
Systems and methods are described for performing adaptive thresholding on key performance indicator (KPI) values using an online machine learning algorithm as the KPI values or the data from which the KPI values are derived is being ingested. For example, the system can identify outliers in a moving window of KPI values. To implement the adaptive thresholding, the system may identify seasonality and/or trend components in historical KPI values. When a new KPI value is obtained, the system may remove the identified seasonality and/or trend components from the KPI value, and determine whether the modified KPI value is an outlier using sketches or quantiles. The system can then repeat this process for each subsequently received KPI value.