The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2023

Filed:

Jan. 28, 2021
Applicant:

Viavi Solutions Inc., San Jose, CA (US);

Inventor:

Reiner Schnizler, Eningen Unter Achalm, DE;

Assignee:

VIAVI SOLUTIONS INC., Chandler, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/42 (2006.01); G06F 5/06 (2006.01); G06F 5/16 (2006.01); H04L 25/14 (2006.01); H04L 47/56 (2022.01);
U.S. Cl.
CPC ...
G06F 5/065 (2013.01); G06F 5/16 (2013.01); G06F 13/4291 (2013.01); H04L 25/14 (2013.01); H04L 47/56 (2013.01);
Abstract

The disclosure relates to detecting phase slips that may occur in a multi-lane serial datalink. Phase slips may occur when a lane experiences lane skew, which may introduce a phase slip with respect to another lane. To detect phase slippage, the system may select a reference lane from among the lanes. The system may generate a pre-deskew delta value based on a difference between the FIFO filling level of the reference lane before a deskew and the FIFO filling level of a second lane before the deskew. The system may generate a post-deskew delta value based on a difference between the FIFO filling level of the reference lane after the deskew and the FIFO filling level of the second lane after the deskew. The system may use a difference between the post-deskew delta and the pre-deskew delta to detect phase slip on the second lane relative to the reference lane.


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