The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2023

Filed:

Feb. 26, 2021
Applicant:

University of Florida Research Foundation, Inc., Gainesville, FL (US);

Inventors:

William R Eisenstadt, Gainesville, FL (US);

Anurag Tulsiram, Gainesville, FL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G05F 1/575 (2006.01);
U.S. Cl.
CPC ...
G05F 1/575 (2013.01); G01R 31/2884 (2013.01);
Abstract

The present disclosure describes systems and methods for identifying defective components in a power integrated circuit. In one such system, a voltage regulator circuit is embedded in an integrated circuit device, wherein the voltage regulator circuit includes a control feedback loop having a compensation capacitor that is configured to maintain a stable output voltage of the voltage regulator voltage at a set value or range. Additionally, a test circuitry is embedded in the integrated circuit device, wherein the test circuitry comprises a voltage source that is configured to generate a cyclical test input signal that passes through the control feedback loop. Accordingly, the test circuitry is configured to provide a test output signal to an output pin of the integrated circuit device that indicates a performance level of the compensation capacitor in the control feedback loop of the voltage regulator circuit. Other systems and methods are also included.


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