The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2023
Filed:
Dec. 19, 2020
Imec Vzw, Leuven, BE;
Katholieke Universiteit Leuven, Leuven, BE;
Zhenxiang Luo, Leuven, BE;
Abdulkadir Yurt, Heverlee, BE;
Dries Braeken, Leuven, BE;
Liesbet Lagae, Leuven, BE;
Richard Stahl, Rotselaar, BE;
IMEC VZW, Leuven, BE;
KATHOLIEKE UNIVERSITEIT LEUVEN, Leuven, BE;
Abstract
A method for three-dimensional imaging of a sample () comprises: receiving () interference patterns () acquired using light-detecting elements (), wherein each interference pattern () is formed by scattered light from the sample () and non-scattered light from a light source (), wherein the interference patterns () are acquired using different angles between the sample () and the light source (); performing digital holographic reconstruction applying an iterative algorithm to change a three-dimensional scattering potential of the sample () to improve a difference between the received interference patterns () and predicted interference patterns based on the three-dimensional scattering potential; wherein the iterative algorithm reduces a sum of a data fidelity term and a non-differentiable regularization term and wherein the iterative algorithm includes a forward-backward splitting method alternating between forward gradient descent () on the data fidelity term and backward gradient descent () on the regularization term.