The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2023

Filed:

Jun. 03, 2022
Applicant:

Rockley Photonics Limited, Altrincham, GB;

Inventors:

Trevor Fowler, Los Angeles, CA (US);

Richard Grote, Rancho Cucamonga, CA (US);

Miguel Ángel Guillén-Torres, Los Angeles, CA (US);

Caroline Lai, Sierra Madre, CA (US);

Haydn Frederick Jones, London, GB;

Assignee:

Rockley Photonics Limited, Altrincham, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/11 (2006.01); G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
G02F 1/116 (2013.01); G02F 1/113 (2013.01); G01J 2001/4247 (2013.01);
Abstract

An optical instrument for determining a wavelength of light generated by a light source. The optical instrument may include a signal generator for generating a driving signal, a tunable optical filter device configured to receive the driving signal, the tunable optical filter device configured to diffract the light generated by the light source based on the driving signal, an optical detector device configured to detect a timing of maximum diffraction of light diffracted by the tunable optical filter device, and an analyzer configured to determine the wavelength of the light based the timing of maximum diffraction.


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