The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2023
Filed:
Sep. 18, 2017
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Florian Fahrbach, Mannheim, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A light microscope includes a scan illumination unit, which is designed to illuminate a specimen having a line focus produced by an illumination light beam and moved transversely to a light propagation direction. A descanned detection unit is designed to produce a stationary first line image of a target region from detection light that originates from a target region of the specimen illuminated with the moving line focus. The scan illumination unit and the descanned detection unit have a common objective, which is designed to receive both the illumination light beam and the detection light. The descanned detection unit contains a dispersive element, which is designed to spectrally split the detection light in order to generate multiple second line images, corresponding to the first line image, with different spectral compositions.