The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2023

Filed:

Mar. 03, 2021
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventor:

Gary Lennen, Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/29 (2010.01); G01S 19/24 (2010.01); G01S 19/00 (2010.01);
U.S. Cl.
CPC ...
G01S 19/29 (2013.01); G01S 19/24 (2013.01); G01S 19/246 (2013.01);
Abstract

An apparatus, a method, a method of manufacturing an apparatus, and a method of constructing an integrated circuit are provided. The apparatus includes a memory; and a processor configured to acquire K values with N peaks, where K and N are integers; select J of the N peaks and include the J peaks in track, where J is an integer less than or equal to N; determine a metric using acquisition non-coherent summations (NCSs) and track NCSs of coherent correlations; determine to not abandon the measurement based on the metric; and form a measurement responsive to determining to not abandon.


Find Patent Forward Citations

Lennen, Gary. (2023). System and method for improved gnss sensitivity via combining acquisition and track correlation hypotheses (U.S. Patent No. 11686854). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11686854

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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