The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2023
Filed:
Aug. 24, 2020
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Sirish Boddikurapati, Garland, TX (US);
Amit Nahar, Allen, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06N 3/02 (2006.01); G06F 30/333 (2020.01);
U.S. Cl.
CPC ...
G01R 31/2894 (2013.01); G01R 31/287 (2013.01); G06F 30/333 (2020.01); G06N 3/02 (2013.01);
Abstract
An integrated circuit method processes parametric data for each integrated circuit die in a plurality of integrated circuit die to determine an expected data pattern, screens integrated circuit die by comparing a data pattern corresponding to a plurality of parametric data for the integrated circuit die to an expected data pattern and, responsive to the comparing, determining whether a difference between the data pattern corresponding to a plurality of parametric data for the predetermined integrated circuit die and the expected data pattern is beyond a tolerance.