The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2023

Filed:

Jul. 16, 2020
Applicant:

Palogen, Inc., Palo Alto, CA (US);

Inventors:

Imran Ali, Gyeonggi-do, KR;

Kyung Joon Han, Palo Alto, CA (US);

Kang-Yoon Lee, Seoul, KR;

Assignee:

PALOGEN, INC., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/416 (2006.01); B01L 3/00 (2006.01); C12Q 1/6869 (2018.01); G01N 27/447 (2006.01); G01N 33/487 (2006.01);
U.S. Cl.
CPC ...
G01N 27/4163 (2013.01); B01L 3/502761 (2013.01); C12Q 1/6869 (2013.01); G01N 27/44791 (2013.01); G01N 33/48721 (2013.01); B01L 2200/0647 (2013.01);
Abstract

A method of calibrating a nanofluidic device including a plurality of nanopore channels, a plurality of gating nanoelectrodes, and a plurality of sensing nanoelectrodes, includes applying a selecting voltage across a gating nanoelectrode of the plurality of gating nanoelectrodes to select a nanopore channel. The method also includes tuning the nanopore channel by applying a first biasing voltage across a sensing electrode of the plurality of sensing nanoelectrodes, and receiving a plurality of currents over a plurality of frequencies. The method further includes generating a calibration data set from the pluralities of frequencies and currents. Moreover, the method includes comparing the calibration data set with a reference data set. In addition, the method includes when the calibration data set differs from the reference data set by more than a predetermined threshold, repeating the method with a second biasing voltage different from the first biasing voltage.


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