The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2023
Filed:
May. 23, 2018
Fundació Institut DE Ciències Fotòniques, Barcelona, ES;
Institució Catalana DE Recerca I Estudis Avançats, Barcelona, ES;
Valerio Pruneri, Barcelona, ES;
Roland Alfonso Terborg, Barcelona, ES;
Josselin Pello, Barcelona, ES;
Marc Jofre, Barcelona, ES;
Pedro Martinez, Barcelona, ES;
FUNDACIÓ INSTITUT DE CIÈNCIES FOTÔNIQUES, Barcelona, ES;
INSTITUCIÓ CATALANA DE RECERCA I ESTUDIS AVANÇATS, Barcelona, ES;
Abstract
The invention relates to an apparatus for probing a sample comprising a light source for emitting an illuminating light beam, a birefringent element for splitting the illuminating light beam into two sheared beams, a reflective element for reflecting the two sheared beams, wherein the apparatus is configured such that the reflected beams propagate through the birefringent element for recombining the reflected beams, and a detector for detecting the recombined beam, wherein the sample is arrangeable in the optical path of the sheared beams or at the backside of a reflective surface in the optical path of the sheared beams, the reflective surface exhibiting a surface plasmon resonance or a localized surface plasmon resonance.