The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2023
Filed:
May. 19, 2022
Tsung-hsien Ou, Taoyuan, TW;
Hsin-yueh Sung, Taoyuan, TW;
Shih-min Hsu, Taoyuan, TW;
Yu-hsuan Lin, Taoyuan, TW;
Tsung-Hsien Ou, Taoyuan, TW;
Hsin-Yueh Sung, Taoyuan, TW;
Shih-Min Hsu, Taoyuan, TW;
Yu-Hsuan Lin, Taoyuan, TW;
Chroma ATE Inc., Taoyuan, TW;
Abstract
The invention provides an optical measurement device for measuring light to be inspected. The optical measurement device comprises a light receiving module, a light splitting module, and a plurality of color filters. The light receiving module is used for converting the light to be inspected into a first parallel light. The light splitting module is used for splitting the first parallel light into a plurality of parallel lights to be inspected. Each color filter receives at least one of the plurality of parallel lights to be inspected. The plurality of parallel lights to be inspected filtered by the plurality of color filters are used to calculate tristimulus values in the CIE color space.