The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2023

Filed:

Jun. 19, 2018
Applicant:

Sumitomo Metal Mining Co., Ltd., Tokyo, JP;

Inventors:

Mika Okada, Isa, JP;

Takeshi Chonan, Isa, JP;

Hirofumi Tsunematsu, Isa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09D 11/101 (2014.01); B29C 64/124 (2017.01); C09D 11/033 (2014.01); C09D 11/037 (2014.01); B33Y 70/10 (2020.01); B33Y 10/00 (2015.01);
U.S. Cl.
CPC ...
C09D 11/101 (2013.01); B29C 64/124 (2017.08); B33Y 70/10 (2020.01); C09D 11/033 (2013.01); C09D 11/037 (2013.01); B33Y 10/00 (2014.12);
Abstract

A near-infrared curable ink composition on a predetermined substrate that has excellent adhesion to the substrate when irradiated with near-infrared rays and cured, a near-infrared curable film obtained from the near-infrared curable ink composition, and stereolithography using the near-infrared curable ink composition, and contains composite tungsten oxide fine particles as near-infrared absorbing fine particles and uncured thermosetting resin, wherein the composite tungsten oxide fine particles have a XRD peak top intensity ratio value of 0.13 or more based on a XRD peak intensity ratio value of 1 on plane (220) of a silicon powder standard sample (640c produced by NIST).


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