The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2023

Filed:

Dec. 04, 2020
Applicant:

United States of America As Represented BY the Administrator of Nasa, Washington, DC (US);

Inventors:

Peter D. Juarez, Hampton, VA (US);

Elizabeth D. Gregory, Hampton, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B29C 70/38 (2006.01); B29C 70/54 (2006.01); G01N 21/88 (2006.01); G01N 21/93 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
B29C 70/382 (2013.01); B29C 70/545 (2013.01); G01N 21/8851 (2013.01); G01N 21/93 (2013.01); G01N 2021/8472 (2013.01); G01N 2021/8874 (2013.01);
Abstract

Systems, methods, and devices are provided for the creation of predictable and accurate defects in a fiber tow of an Automated Fiber Placement (AFP) process, with such artificial defects being useful to support calibration of an in situ inspection system used in the AFP process. Various embodiments include methods for creating such artificial defects that support calibration of an in situ inspection system of an AFP system or process. Various embodiments may also include a defect stencils for an AFP system or process.


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